Thermo Avantage Xps Software 24 'link' -

One of the most tedious aspects of XPS analysis is selecting the correct background (Shirley, Tougaard, or Linear). introduces an intelligent background detection algorithm that analyzes the spectral noise and slope to suggest the optimal background model. For overlapping peaks, the software’s "Smart Peak Fitting" library automatically recognizes doublets (e.g., Si 2p, S 2p, Cr 2p) and applies the correct spin-orbit splitting rules without manual intervention.

Apply RSFs to generate a baseline atomic concentration table. Step 3: High-Resolution Peak Fitting Navigate to specific elemental regions (e.g., ) to determine chemical environments: Select an appropriate background type.

For pricing, upgrade eligibility, and a 30-day trial license of Thermo Avantage XPS Software 24, contact your local Thermo Fisher Scientific representative or visit their official website. Thermo Avantage Xps Software 24

The user loads the raw .vgd file. Avantage 24 automatically identifies Fe, Cr, Ni, O, and C. The AI notes that the C 1s peak is shifted by 3.2 eV and applies the advanced charge correction.

[Import/Open Data] ➔ [Energy Calibration] ➔ [Background Subtraction] ➔ [Peak Fitting] ➔ [Quantification] Step 1: Data Import and Inspection One of the most tedious aspects of XPS

After establishing a perfect peak-fitting model for one sample, the entire parameters layout can be saved as a template and applied instantly to dozens of similar files.

Who it's best for

Beyond basic processing, Avantage includes highly specialized modules tailored for complex surface science applications. Depth Profiling Analysis

Data can be directly converted into Excel spreadsheets, Word reports, or exported as .txt / .vms (VAMAS) files for external plotting software like Origin or Igor Pro. Apply RSFs to generate a baseline atomic concentration table

XPS仪器能产出高精度的原始数据，但真正决定分析效率、数据质量和结果准确性的，其实是其背后的软件系统——现代XPS分析的所有环节，从仪器控制、数据采集、数据处理到报告编制，都高度依赖软件来完成。Thermo Scientific™ 正是为这一使命而生。

Managing hardware components, setting up acquisition parameters (pass energy, dwell time, step size), optimizing the X-ray source, and controlling automated sample stages or depth profiling ion guns.