Verigy 93k Tester Manual [TRUSTED]

: This automated routine aligns driver and comparator timing edges across every channel in the system. It removes trace-length skews up to the test head boundary, lowering channel-to-channel timing alignment jitter to well under 100 picoseconds. 6. Advanced Debugging Capabilities

: Defines equations, periods, edges, and time-set switches.

The manuals provide strict guidelines on water cooling maintenance to prevent overheating during high-power tests. 4. Operational Guidelines from the Manual verigy 93k tester manual

The hardware documentation includes detailed diagrams and procedures for:

An automated software routine that calibrates timing, skew, and PMU offsets directly inside the test head. It should be run weekly or whenever the ambient temperature deviates past the specified threshold ( Debugging Failed Tests : This automated routine aligns driver and comparator

Determine the routing behavior based on the test outcome. For instance, if the test fails, route the flow directly to a Hard Bin (e.g., Bin 5: Functional Fail ) to optimize test time. 4. Troubleshooting, Calibration, and Diagnostic Routines

This physical channel is later mapped to a logical name (DUT pin name) within the SmarTest software workspace. 2. The SmarTest Software Workspace its impact on the industry

The Verigy V93000 (often referred to as the 93k) is a premier Automated Test Equipment (ATE) platform used globally for semiconductor testing. While a technical manual provides the "how-to," an essay on the system explores its architecture, its impact on the industry, and the philosophy behind its "universal" design. The Evolution of Semiconductor Testing: The Verigy V93000

Creating a test program requires a few standard steps. You must define how the tester connects to the chip and what signals to send. Pin Configuration